High-Contrast SEM Imaging of Supported Few-Layer Graphene for Differentiating Distinct Layers and Resolving Fine Features: There is Plenty of Room at the Bottom-Reference-Cited by-同舟云学术

High-Contrast SEM Imaging of Supported Few-Layer Graphene for Differentiating Distinct Layers and Resolving Fine Features: There is Plenty of Room at the Bottom

Published:2018-05 Issue:22 Volume:14 Page:1704190
ISSN:1613-6810
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Author:

Huang Li¹²^ORCID,Zhang Dan¹²,Zhang Fei-Hu³,Feng Zhi-Hong⁴,Huang Yu-Dong¹²,Gan Yang¹²^ORCID

Affiliation:

1. School of Chemistry and Chemical Engineering; Harbin Institute of Technology; Harbin 150001 China

2. MIIT Key Laboratory of Critical Materials Technology for New Energy Conversion and Storage; School of Chemistry and Chemical Engineering; Harbin Institute of Technology; Harbin 150001 China

3. Manufacturing Engineering for Aviation and Aerospace; School of Mechatronics Engineering; Harbin Institute of Technology; Harbin 150001 China

4. ASCI Laboratory; Hebei Semiconductor Research Institute; Shijiazhuang 050051 China

Funder

National Natural Science Foundation of China

National Key Research and Development Program of China

Key Scientific and Technological Research Fund of Heilongjiang Province

Publisher

Wiley

Subject

Biomaterials,Biotechnology,General Materials Science,General Chemistry

Reference60 articles.

1. Electric Field Effect in Atomically Thin Carbon Films