In-Column Backscattered Electron Microscopy for a Rapid Identification of the Number of Layers in MoS2 Nanosheets: Implications for Electronic and Optoelectronic Devices

Author:

Sharbidre Rakesh S.12ORCID,Narute Prashant1ORCID,Byen Ji Cheol13,Kim Doyeon1,Park Jaesung1ORCID,Park Byong Chon1ORCID,Hong Seong-Gu13ORCID

Affiliation:

1. Interdisciplinary Materials Measurement Institute, Korea Research Institute of Standards and Science, Daejeon34113, Republic of Korea

2. Physiological Signal Processing and Measurement Solution, Physionics, Daejeon34027,Republic of Korea

3. Department of Nano Science, University of Science and Technology, Daejeon34113, Republic of Korea

Funder

Ministry of Science and ICT, South Korea

Korea Research Institute of Standards and Science

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

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