Simple Approach for High-Contrast Optical Imaging and Characterization of Graphene-Based Sheets-Reference-Cited by-同舟云学术

Simple Approach for High-Contrast Optical Imaging and Characterization of Graphene-Based Sheets

Published:2007-11-02 Issue:12 Volume:7 Page:3569-3575
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Jung Inhwa¹,Pelton Matthew¹,Piner Richard¹,Dikin Dmitriy A.¹,Stankovich Sasha¹,Watcharotone Supinda¹,Hausner Martina¹,Ruoff Rodney S.¹

Affiliation:

1. Department of Mechanical Engineering, Northwestern University, Evanston, Illinois 60208, Center for Nanoscale Materials, Argonne National Laboratory, Argonne, Illinois 60439, and Department of Chemistry and Biology, Ryerson University, 350 Victoria Street, Toronto, Ontario M5B 2K3, Canada

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/nl0714177

Reference28 articles.

1. Electric Field Effect in Atomically Thin Carbon Films

2. Two-dimensional atomic crystals

3. Atomic Force Microscopy Study of Clay Nanoplatelets and Their Impurities

4. Mechanics of hydrogenated amorphous carbon deposits from electron-beam-induced deposition of a paraffin precursor

5. High-resolution imaging ellipsometer

Cited by 325 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A review on SEM imaging of graphene layers;Micron;2024-12

2. Optical contrast analysis of α-RuCl3 nanoflakes on oxidized silicon wafers;APL Materials;2024-07-01

3. Dual Drug Delivery in Cancer Therapy Using Graphene Oxide‐Based Nanoplatforms;Advanced NanoBiomed Research;2024-05-19

4. Unveiling the Intricacies;2D Nanomaterials;2024-04-19

5. Deterministic reflection contrast ellipsometry for thick multilayer two-dimensional heterostructures;Nanophotonics;2024-02-07