Quantitative AES IX and quantitative XPS II: Auger and x-ray photoelectron intensities and sensitivity factors from spectral digital databases reanalysed using a REELS database-Reference-Cited by-同舟云学术

Quantitative AES IX and quantitative XPS II: Auger and x-ray photoelectron intensities and sensitivity factors from spectral digital databases reanalysed using a REELS database

Published:2001 Issue:8 Volume:31 Page:778-795
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Seah M. P.,Gilmore I. S.,Spencer S. J.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference51 articles.

1. Practical Sur;Seah,1990

2. High resolution digital Auger database of true spectra for Auger electron spectroscopy intensities

3. AES: Accurate intensity calibration of electron spectrometers—results of a BCR interlaboratory comparison co-sponsored by the VAMAS SCA TWP

4. XPS reference procedure for the accurate intensity calibration of electron spectrometers? results of a BCR intercomparison co-sponsored by the VAMAS SCA TWA

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