Meta-Model based High-Dimensional Yield Analysis using Low-Rank Tensor Approximation

Author:

Shi Xiao1,Yan Hao2,Huang Qiancun2,Zhang Jiajia2,Shi Longxing2,He Lei1

Affiliation:

1. State Key Lab of ASIC & System, Microelectronics Dept., Fudan University, China and Electrical and Computer Engineering Dept., University of California, Los Angeles, CA, USA

2. Electrical Engineering Dept., Southeast University, China

Publisher

ACM

Cited by 17 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Integration mixer: An efficient mixed neural network for memory dynamic stability analysis in high dimensional variation space;Integration;2024-07

2. CIS: Conditional Importance Sampling for Yield Optimization of Analog and SRAM Circuits;2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC);2024-01-22

3. OPT: Optimal Proposal Transfer for Efficient Yield Optimization for Analog and SRAM Circuits;2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD);2023-10-28

4. Seeking the Yield Barrier: High-Dimensional SRAM Evaluation Through Optimal Manifold;2023 60th ACM/IEEE Design Automation Conference (DAC);2023-07-09

5. Minimum Max-Rank Method for High-Sigma Yield Analysis;2023 International Symposium of Electronics Design Automation (ISEDA);2023-05-08

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