Meta-Model based High-Dimensional Yield Analysis using Low-Rank Tensor Approximation-Reference-Cited by-同舟云学术

Meta-Model based High-Dimensional Yield Analysis using Low-Rank Tensor Approximation

Published:2019-06-02 Issue: Volume: Page:
ISSN:
Container-title:Proceedings of the 56th Annual Design Automation Conference 2019
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Author:

Shi Xiao¹,Yan Hao²,Huang Qiancun²,Zhang Jiajia²,Shi Longxing²,He Lei¹

Affiliation:

1. State Key Lab of ASIC & System, Microelectronics Dept., Fudan University, China and Electrical and Computer Engineering Dept., University of California, Los Angeles, CA, USA

2. Electrical Engineering Dept., Southeast University, China

Publisher

ACM

Link

https://dl.acm.org/doi/pdf/10.1145/3316781.3317863

Reference12 articles.

1. Hyperspherical Clustering and Sampling for Rare Event Analysis with Multiple Failure Region Coverage

2. High-Dimensional and Multiple-Failure-Region Importance Sampling for SRAM Yield Analysis

3. A fast and robust failure analysis of memory circuits using adaptive importance sampling method

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