A fast and robust failure analysis of memory circuits using adaptive importance sampling method
Author:
Affiliation:
1. UCLA
2. Southeast Univ China
Publisher
ACM
Link
https://dl.acm.org/doi/pdf/10.1145/3195970.3195972
Reference12 articles.
1. Statistical Blockade: A Novel Method for Very Fast Monte Carlo Simulation of Rare Circuit Events, and its Application
2. Recursive Statistical Blockade: An Enhanced Technique for Rare Event Simulation with Application to SRAM Circuit Design
3. REscope
4. Mixture importance sampling and its application to the analysis of SRAM designs in the presence of rare failure events
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1. CIS: Conditional Importance Sampling for Yield Optimization of Analog and SRAM Circuits;2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC);2024-01-22
2. Meta-Model based High-Dimensional Yield Analysis using Low-Rank Tensor Approximation;Proceedings of the 56th Annual Design Automation Conference 2019;2019-06-02
3. Adaptive Clustering and Sampling for High-Dimensional and Multi-Failure-Region SRAM Yield Analysis;Proceedings of the 2019 International Symposium on Physical Design;2019-04-04
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