Adaptive Clustering and Sampling for High-Dimensional and Multi-Failure-Region SRAM Yield Analysis-Reference-Cited by-同舟云学术

Adaptive Clustering and Sampling for High-Dimensional and Multi-Failure-Region SRAM Yield Analysis

Published:2019-04-04 Issue: Volume: Page:
ISSN:
Container-title:Proceedings of the 2019 International Symposium on Physical Design
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Author:

Shi Xiao¹,Yan Hao²,Wang Jinxin²,Xu Xiaofen²,Liu Fengyuan²,Shi Longxing²,He Lei¹

Affiliation:

1. Fudan University & University of California, Los Angeles, Shanghai, China

2. Southeast University, Nanjing, China

Funder

National Natural Science Foundation of China

Publisher

ACM

Link

https://dl.acm.org/doi/pdf/10.1145/3299902.3309748

Reference13 articles.

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2. L He Fang Gong Rahul Krishnan and Hao Yu. Exploiting parallelism by data dependency elimination: A case study of circuit simulation algorithms. IEEE Design & Test of Computers page 1 2012. L He Fang Gong Rahul Krishnan and Hao Yu. Exploiting parallelism by data dependency elimination: A case study of circuit simulation algorithms. IEEE Design & Test of Computers page 1 2012.

3. Statistical Blockade: A Novel Method for Very Fast Monte Carlo Simulation of Rare Circuit Events, and its Application

4. Recursive Statistical Blockade: An Enhanced Technique for Rare Event Simulation with Application to SRAM Circuit Design

5. REscope

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