OPT: Optimal Proposal Transfer for Efficient Yield Optimization for Analog and SRAM Circuits
Author:
Affiliation:
1. School of Integrated Circuit Science and Engineering, Beihang University,Beijing,China
2. College of Mechatronics and Control Engineering, Shenzhen University,Shenzhen,China
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10323590/10323543/10323689.pdf?arnumber=10323689
Reference21 articles.
1. Fast and Efficient High-Sigma Yield Analysis and Optimization using Kernel Density Estimation on a Bayesian Optimized Failure Rate Model
2. Min Norm Failure Vector Guided Yield Optimization Method for Nanometer SRAM Design
3. Information-Theoretic Regret Bounds for Gaussian Process Optimization in the Bandit Setting
4. Sensitivity Importance Sampling Yield Analysis and Optimization for High Sigma Failure Rate Estimation
5. Hyperspherical Clustering and Sampling for Rare Event Analysis with Multiple Failure Region Coverage
Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Yield Maximization of Flip-Flop Circuits Based on Deep Neural Network and Polyhedral Estimation of Nonlinear Constraints;IEEE Access;2024
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