Affiliation:
1. National Institute of Advanced Industrial Science and Technology (AIST) and CREST-Japan Science and Technology Agency
2. National Institute of Advanced Industrial Science and Technology (AIST), CREST-Japan Science and Technology Agency, and Meiji University
3. National Institute of Advanced Industrial Science and Technology (AIST)
Abstract
A new method for improving the timing yield of
field-programmable gate array (FPGA) devices affected by intrinsic
within-die variation is proposed. The timing variation is reduced
by selecting an appropriate configuration for each chip from a set
of independent configurations, the critical paths of which do not
share the same circuit resources on the FPGA. In this article, the
actual method used to generate independent multiple configurations
by simply repeating the routing phase is shown, along with the
results of Monte Carlo simulation with 10,000 samples. One
simulation result showed that the standard deviations of maximum
critical path delays are reduced by 28% and 49% for 10% and 30%
V
th
variations (
σ/ μ
), respectively,
with 10 independent configurations. Therefore, the proposed method
is especially effective for larger V
th
variation and is
expected to be useful for suppressing the performance variation of
FPGAs due to the future increase of parameter variation. Another
simulation result showed that the effectiveness of the proposed
technique was saturated at the use of 10 or more configurations
because of the degradation of the quality of the configurations.
Therefore, the use of 10 or fewer configurations is reasonable.
Publisher
Association for Computing Machinery (ACM)
Cited by
4 articles.
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