Impact of extrinsic and intrinsic parameter fluctuations on CMOS circuit performance-Reference-Cited by-同舟云学术

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Impact of extrinsic and intrinsic parameter fluctuations on CMOS circuit performance

Published:2000-08 Issue:8 Volume:35 Page:1186-1193
ISSN:0018-9200
Container-title:IEEE Journal of Solid-State Circuits
language:
Short-container-title:IEEE J. Solid-State Circuits

Author:

Bowman K.A.,Xinghai Tang ,Eble J.C.,Menldl J.D.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx5/4/18654/00859508.pdf?arnumber=859508

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