Author:
Yang Jie,Capodieci Luigi,Sylvester Dennis
Cited by
8 articles.
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1. Voronoi Diagram Based Heterogeneous Circuit Layout Centerline Extraction for Mask Verification;2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC);2022-01-17
2. Process Variation;Analysis and Design of Networks-on-Chip Under High Process Variation;2015
3. Examination of Process Parameter Variations;Process Variations and Probabilistic Integrated Circuit Design;2011-10-08
4. IC DfM for Devices and Products;Semiconductors;2011-09-08
5. Variability in nanometer CMOS: Impact, analysis, and minimization;Integration;2008-05