Inference of Ga Ion TOF-SIMS Fragments of Metal-chlorides and -oxides.
Author:
Affiliation:
1. ULVAC-PHI, Inc.
Publisher
Surface Science Society Japan
Subject
General Earth and Planetary Sciences,General Engineering,General Environmental Science
Link
http://www.jstage.jst.go.jp/article/jsssj/21/10/21_10_651/_pdf
Reference7 articles.
1. Inference and Re-classification of TOF-SIMS Fragments for the Identification of Organic Compounds.
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4. Sims studies of the adsorption of O2, CO and CO2 on titanium using low primary energies
5. Effect of residual oxygen on the formation of molecular ions in secondary ion mass spectrometry
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