1. V. Leroy, J. P. Servais, L. Habraken: C. Rech. Métall.35, 69 (1973)
2. J. M. Rouberol, J. Guernet, P. Deschamps, J. P. Dagnot, J. M. Guyon de la Berge: V. Int. Conf. X-Ray Optics and Microanalysis, Tübingen 1968 (Springer-Verlag, Berlin, Heidelberg, New York 1969), p. 311