Publisher
Springer Science and Business Media LLC
Reference34 articles.
1. 1. D. Briggs, A. Brown, and J. C. Vickerman, “Handbook of Static Secondary Ion Mass Spectrometry”, 1989, John Wiley & Sons, Chichester.
2. 2. J. C. Vickerman, D. Briggs, and A. Henderson, “The Static SIMS Library, Part 1 and Part 2”, 1998, Surface Spectra Ltd., Manchester.
3. Chemical Analysis of Inorganic and Organic Surfaces and Thin Films by Static Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
4. Empirical formula for the calculation of secondary ion yields from oxidized metal surfaces and metal oxides
5. Secondary ion mass spectrometry as a means of surface analysis
Cited by
9 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献