Empirical formula for the calculation of secondary ion yields from oxidized metal surfaces and metal oxides
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference35 articles.
1. Analysis of Submonolayers on Silver by Negative Secondary Ion Emission
2. Beobachtung von oberflächenreaktionen mit der statischen methode der sekundärionen-massenspektroskopie. I die methode
3. Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)
4. New developments in the surface analysis of solids
5. Analysis of surfaces utilizing sputter ion source instruments
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