Molecular speciation analysis of oxidized metal surfaces by TOF SIMS

Author:

Trzyna-Sowa Małgorzata,Berchenko Nicolas,Dziawa Piotr,Cebulski Józef

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference12 articles.

1. Polytypism in ultrathin tellurium;Apte;2D Materials,2018

2. Topological crystalline insulator states in Pb1−xSnxSe;Dziawa;Nat. Mater.,2012

3. Speciation analysis of trace arsenic, mercury, selenium and antimony in environmental and biological samples based on hyphenated techniques;Yu;Molecules,2019

4. Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS);Benninghoven;Surf. Sci.,1973

5. L. Van Vaeck, TOF-SIMS: Surface Analysis by Mass Spectrometry, 2nd ed., in: J.C. Vickerman, D. Briggs (Eds.), IM Publications LLP, Chichester, 2013, pp. 137.

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