Observation of Ga+ Primary Ion TOF-SIMS Fragment Pattern Obtained from Water Containing Oxide Surfaces.
Author:
Affiliation:
1. ULVAC-PHI Inc.
Publisher
Surface Science Society Japan
Subject
General Earth and Planetary Sciences,General Engineering,General Environmental Science
Link
http://www.jstage.jst.go.jp/article/jsssj/23/12/23_12_736/_pdf
Reference5 articles.
1. Inference of Ga Ion TOF-SIMS Fragments of Metal-chlorides and -oxides.
2. 2) K. Hirokawa, Z. Li and A. Tanaka: Fresenius J. Anal. Chem. 370, 348 (2001).
3. Behaviour of water containing materials in the high vacuum of an X-ray photoelectron spectrometer
4. 4) V.C. Vickerman, D. Briggs and A. Henderson: “The Static SIMS Library, Part 1” (Surface Spectra, Manchester, 1998).
5. Regularity of Ga+ Primary Ion TOF-SIMS Fragment Pattern of Inorganic Compounds.
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2. Regularity of fragment pattern appearance in the Ga+ primary ion ToF-SIMS;BUNSEKI KAGAKU;2004
3. Ga+ primary ion ToF-SIMS fragment pattern of inorganic compounds and metals;Applied Surface Science;2003-12
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