Author:
Bahir G.,Kalish R.,Tserruya I.
Cited by
8 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Study of radiation damage on proton-bombarded GaP by PIXE;Crystal Research and Technology;1987-12
2. Depth profiling by particle‐induced x‐ray emission analysis using a parameter‐fitting technique;Journal of Applied Physics;1987-11
3. The characterization of semiconductor materials by backscattering spectroscopy;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1985-05
4. PIXE analysis of thick targets;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1984-04
5. PIXE analysis of compound materials;Nuclear Instruments and Methods in Physics Research;1983-12