PIXE analysis of compound materials-Reference-Cited by-同舟云学术

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PIXE analysis of compound materials

Published:1983-12 Issue:1-3 Volume:218 Page:415-419
ISSN:0167-5087
Container-title:Nuclear Instruments and Methods in Physics Research
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research

Author:

Kalish R.,Bahir G.

Publisher

Elsevier BV

Subject

General Engineering

Reference11 articles.

1. Monte Carlo Channeling Calculations

2. Structure of ion‐implanted and annealed Hg1−xCdxTe

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Internal distortion in GaInAsP quaternary alloys studied by ion channeling;Physica Status Solidi (a);1988-07-16

2. Measurements of Al content in Ga1−xAlxAs using nuclear resonances;Journal of Applied Physics;1986-09-15

3. Analysis by absorption and scattering of radiation;Journal of Radioanalytical and Nuclear Chemistry Articles;1986-06

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