Author:
Flagmeyer R.,Frey H.,Gottschalch V.
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. RBS analysis of heteroepitaxial layered structures;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1992-05
2. The interpretation of the FOLZ reflection fine structure in CBED patterns of GaInAsP;Philosophical Magazine B;1991-06
3. Analysis of lattice distortion in InxGa1−xAs crystals by dechanneling;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1990-04
4. InGaAsP quaternary layers on InP (100) substrate analysed by ion backscattering and channeling;Crystal Research and Technology;1989-03