Author:
Benka O.,Geretschläger M.,Paul H.
Subject
General Physics and Astronomy
Cited by
25 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Determination of iron concentration profiles in Fe-Ni by the PIXE method;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1990-05
2. Applications of the concentration depth profiling with PIXE;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1990-04
3. A new method for determining the depth profile of trace elements by PIXE;Journal of Physics D: Applied Physics;1990-02-14
4. Depth profiling of element concentration using low energy proton induced X-ray emission;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1988-12
5. The role of the ionization and stopping cross sections in PIXE thin film thickness measurements;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1988-09