Author:
Chang S.-J.,Bawedin M.,Xiong W.,Jeon S.C.,Lee J.-H.,Cristoloveanu S.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
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4. A New 40-nm SONOS Structure Based on Backside Trapping for Nanoscale Memories
5. A Nanoscale Memory and Transistor Using Backside Trapping
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