Author:
Mounir Mahmoud Mohamed,Soin Norhayati
Funder
University of Malaya/Ministry of Higher Education High Impact Research Grant
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference94 articles.
1. Consistency of the two component composite modeling framework for NBTI in large and small area p-MOSFETs;Chaudhary;IEEE Transactions on Electron Devices,2017
2. Fabrication of body-tied FinFETs (Omega MOSFETs) using bulk Si wafers;Park,2003
3. Multiple-gate SOI MOSFETs: device design guidelines;Park;Electron Devices, IEEE Transactions on,2002
4. A unified aging model of NBTI and HCI degradation towards lifetime reliability management for nanoscale MOSFET circuits;Wang,2011
5. Sub 50-nm finfet: Pmos;Huang,1999
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