Author:
Li B.,Huang Y.,Wu J.,Huang Y.,Li B.,Zhang Q.,Yang L.,Wan F.,Luo J.,Han Z.,Yin H.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference19 articles.
1. Planar bulk MOSFETs versus FinFETs: an analog/RF perspective;Subramanian;IEEE Trans. Electron Devices,2006
2. A 22 nm SoC platform technology featuring 3-D tri-gate and high-k/metal gate, optimized for ultra low power, high performance and high density SoC applications;Jan,2012
3. FinFETs and Other Multi-Gate Transistors;Colinge,2008
4. Total dose radiation and annealing responses of the back transistor of Silicon-On-Insulator pMOSFETs;Zhao;Chinese Physics C,2015
5. The total ionizing dose response of a DSOI 4Kb SRAM;Li;Microelectron. Reliab.,2017
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