Author:
Zhang Jinli,Hu Jinbao,You Hailong,Jia Renxu,Wang Xiaowen,Zhang Xiaowen
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference22 articles.
1. NBTI and irradiation related degradation mechanisms in power VDMOS transistors;Stojadinović;Microelectron. Reliab.,2018
2. The threshold voltage degradation model of N Channel VDMOSFETs under PBT stress;Ye;Microelectron. Reliab.,2018
3. Low magnetic field impact on NBTI degradation;Merah;Microelectron. Reliab.,2015
4. Auxiliary particle filtering-based estimation of remaining useful life of IGBT;Haque;IEEE Trans. Ind. Electron.,2017
5. In situ diagnostics and prognostics of wire bonding faults in IGBT modules for electric vehicle drives;Ji;IEEE Trans. Power Electron.,2013
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