Funder
National Key R&D Program of China
National Natural Science Foundation of China
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference36 articles.
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5. NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs;Dankovic;Microelectron. Reliab.,2006
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5 articles.
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