Research on Lifetime Evaluation of IGBT Module in Wave Energy Converter Considering Environmental Uncertainty
Author:
Affiliation:
1. Chongqing University,State Key Laboratory of Power Transmission Equipment & System Security and New Technology,Chongqing,China
Funder
Nature
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10239547/10239550/10239666.pdf?arnumber=10239666
Reference13 articles.
1. Numerical junction temperature calculation method for reliability evaluation of power semiconductors in power electronics converters;du;Journal of Power Electronics,2020
2. Mission Profile-Oriented Control for Reliability and Lifetime of Photovoltaic Inverters
3. A Novel Online Chip-Related Aging Monitoring Method for IGBTs Based on the Leakage Current
4. A remaining useful life prediction method of IGBT based on online status data
5. Performance enhancement of submerged wave energy device using bistability
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3