Functional delay test generation based on software prototype-Reference-Cited by-同舟云学术

Functional delay test generation based on software prototype

Published:2009-12 Issue:12 Volume:49 Page:1578-1585
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Bareisa Eduardas,Jusas Vacius,Motiejunas Kestutis,Seinauskas Rimantas

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference25 articles.

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3. Pomeranz I, Reddy SM. Functional test generation for delay faults in combinational circuits. In: Proceedings of 1995 international conference on computer-aided-design (1995); 1995. p. 687–94.

4. Realization-independent ATPG for designs with unimplemented blocks;Kim;IEEE Trans CAD,2001

5. Yi J, Hayes JP. a fault model for function and delay testing. In: Proceedings of the IEEE European test workshop, ETW’ 01; 2001. p. 27–34.

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