1. Scan to nonscan conversion via test cube analysis;Sinanoglu;IEEE Trans Very Large Scale Integration (VLSI) Syst,2013
2. Dasgupta S, Walther RG, Williams TW, Eichelberger EB. An enhancement to LSSD and some applications of LSSD in reliability, availability and serviceability. In: Proceedings of the international symposium on fault tolerant computing; 1981. p. 880–5.
3. Patil S, Savir J. Skewed-load transition test: Part II. Coverage. In: Proceedings of the IEEE international test conference; 1992. p. 714–22.
4. Broad-side delay test;Savir;IEEE Trans Comput-Aided Des Integrated Circuits Syst,1994
5. Bhunia S, Mahmoodi H, Raychowdhury A, Roy K, A novel low-overhead delay testing technique for arbitrary two-pattern test application. In: Proceedings of design, automation and test in Europe conference and exhibition; 2005. p. 1136–41.