Effect of p-n interface on resistive switching of NiO/CeO2 thin films

Author:

Li Jian-ChangORCID,Cui Hai-Peng,Hou Xue-Yan

Funder

National Natural Science Foundation of China

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Mechanical Engineering,Mechanics of Materials

Reference41 articles.

1. Reversible transition between bipolar and unipolar resistive switching in Cu2O/Ga2O3 binary oxide stacked layer;Zhi;AIP Adv.,2016

2. Effect of ZrOx/HfOx bilayer structure on switching uniformity and reliability in nonvolatile memory applications;Lee;Appl. Phys. Lett.,2010

3. Effect of oxygen content and superconductivity on the nonvolatile resistive switching in YBa2Cu3O6+x/Nb-doped SrTiO3 heterojunctions;Zhang;Appl. Phys. Lett.,2009

4. Low resistivity p–ZnO films fabricated by sol–gel spin coating;Cao;Appl. Phys. Lett.,2006

5. Collective motion of conducting filaments in Pt/n–Type TiO2/p–type NiO/Pt stacked resistance switching memory;Kim;Adv. Funct. Mater.,2011

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