Author:
Ioannidis E.G.,Haendler S.,Theodorou C.G.,Lasserre S.,Dimitriadis C.A.,Ghibaudo G.
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference13 articles.
1. Electrical noise as a measure of quality and reliability in electronic devices;Jones;Adv Electron Electron Phys,1993
2. Design considerations for CMOS design near the limits of scaling;Frank;Solid State Electron,2002
3. Takeuchi K, Nagumo T, Yokogawa S, Imai K, Hayashi Y. Single-charge-based modeling of transistor characteristics fluctuations based on statistical measurement of RTN amplitude. In: 2009 Symposium on VLSI technology digest of Technical papers. p. 54–5.
4. The impact of RTN on performance fluctuation in CMOS logic circuits;Ito;Proc IEEE IRPS,2011
5. Impact of dynamic variability on the operation of CMOS inverter;Ioannidis;Electron Lett,2013
Cited by
14 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献