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Electrical Noise as a Measure of Quality and Reliability in Electronic Devices

  • Published:1993 Issue: Volume: Page:201-257
  • ISSN:0065-2539
  • Container-title:Advances in Electronics and Electron Physics Volume 87
  • language:
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Author:

Jones B.K.

Publisher

Elsevier

Reference204 articles.

1. Correlation between trap characteristics by low-frequency noise, mutual conductance dispersion, oscillations and DLTS in GaAs MESFETs;Abdala;Solid-State Electr.,1992

2. Electronic Noise;Ambrozy,1982

3. Surface effects on the low frequency noise of thin GaAs layers;Ambrozy,1991

4. Effects of structural factors on the 1/f noise of aluminium films;Andrushko;Radiophys. and Quantum Electron.,1981

5. Burst noise in the field emission devices;Bakhtizin;Radio Eng. and Electron Phys. (USA),1981

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