Cryogenic Characterization of Low-Frequency Noise in 40-nm CMOS-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Cryogenic Characterization of Low-Frequency Noise in 40-nm CMOS

Published:2024 Issue: Volume:12 Page:573-580
ISSN:2168-6734
Container-title:IEEE Journal of the Electron Devices Society
language:
Short-container-title:IEEE J. Electron Devices Soc.

Author:

Kiene Gerd¹^ORCID,İlik Sadık¹^ORCID,Mastrodomenico Luigi¹^ORCID,Babaie Masoud²^ORCID,Sebastiano Fabio¹^ORCID

Affiliation:

1. Department of Quantum and Computer Engineering, Delft University of Technology, Delft, The Gravendeel

2. Qutech, Delft, The Netherlands

Funder

Intel Corporation

NXP Semiconductors

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx8/6245494/10416702/10606256.pdf?arnumber=10606256

Reference34 articles.

1. Interfacing spin qubits in quantum dots and donors—hot, dense, and coherent

2. Assessment of electronics for cryogenic space exploration missions

3. Physical Model of Low-Temperature to Cryogenic Threshold Voltage in MOSFETs

4. Characterization and Modeling of 22 nm FDSOI Cryogenic RF CMOS

5. Variable-Temperature Broadband Noise Characterization of MOSFETs for Cryogenic Electronics: From Room Temperature down to 3 K

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP