Optical and electrical evaluations of SiGe layers on insulator fabricated using Ge condensation by dry oxidation
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference24 articles.
1. Electrical characterization of strained Si/SiGe wafers using transient capacitance measurements;Wang;Appl Phys Lett,2005
2. New approach to the growth of low dislocation relaxed SiGe material;Powell;Appl Phys Lett,1994
3. Photoluminescence of pseudomorphic SiGe formed by 74Ge+ ion implantation in the overlayer of silicon-on-insulator material;Patel;Appl Phys Lett,1998
4. SiGe-based semiconductor-on-insulator substrate created by low-energy separation-by-implated-oxygen;Fukatsu;Appl Phys Lett,1998
5. Fabrication of strained Si on an ultrathin SiGe-on-insulator virtual substrate with a high-Ge fraction;Tezuka;Appl Phys Lett,2001
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