Recent Progresses in Nanometer Scale Analysis of Buried Layers and Interfaces in Thin Films by X-rays and Neutrons

Author:

STOEV Krassimir1,SAKURAI Kenji2

Affiliation:

1. Canadian Nuclear Laboratories

2. National Institute for Materials Science

Publisher

Springer Science and Business Media LLC

Subject

Analytical Chemistry

Reference294 articles.

1. 1. “Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications”, ed. G. Friedbacher and H. Bubert, 2nd ed., 2011, John Wiley & Sons.

2. 2. T. Imae, “Nanolayer Research: Methodology and Technology for Green Chemistry”, 2017, Elsevier.

3. 3. J. González-Cobos and A. de Lucas-Consuegra, Catalysts, 2016, 6, 15.

4. 4. “Methods of Surface Analysis”, ed. A. W. Czanderna, 2012, Elsevier.

5. 5. S. Hofmann, “Auger- and X-ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide”, 2012, Springer.

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