Author:
Nassim K.,Joannes L.,Cornet A.,Dilhaire S.,Schaub E.,Claeys W.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference3 articles.
1. Laser probing of thermal behaviour of electronic components and its application in quality and reliability testing;Claeys;Microelectronic Engineering,1994
2. Laser probing techniques and methods for the thermal characterization of microelectronic components;Claeys,1998
3. Use of Electronic Speckle Pattern Interferometry (ESPI) in the measurent of static and dynamic surface displacement;Wykes;Optical Ingineering,1982
Cited by
15 articles.
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