Elucidating the electrical performance and thermal stability in14-nm FinFETs CMOS technology-Reference-Cited by-同舟云学术

Elucidating the electrical performance and thermal stability in14-nm FinFETs CMOS technology

Published:2022-04 Issue: Volume:164 Page:107163
ISSN:2773-0123
Container-title:Micro and Nanostructures
language:en
Short-container-title:Micro and Nanostructures

Author:

Nasri Faouzi^ORCID,Glayed Sirine,Jaba Nejeh,Mera Abir,Atri Mohamed,Machhout Mohsen

Funder

King Khalid University

Deanship of Scientific Research, King Faisal University

Publisher

Elsevier BV

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Biomaterials

Reference26 articles.

1. Self-heating in FinFET and GAA-NW using Si, Ge and III/V channels;Bury;IEDM Tech. Dig.,2016

2. 3D modeling of spatiotemporal heat-transport in III-V gate-all-around transistors allows accurate estimation and optimization of nanowire temperature;Wahab;IEEE Trans. Electron. Dev.,2015

3. Local thermometry of self-heated nanoscale devices;Menges;IEDM Tech. Dig.,2016

4. Self heating characterization of FinFET SOI devices using 2D time resolved emission measurements;Stellari;Proc. IEEE Int. Rel. Phys. Symp. (IRPS), Apr.,2015

5. Impact of self-heating effect on transistor characterization and reliability issues in sub-10 nm technology nodes;Zhao;IEEE J. Electr. Dev. Soc.,2019

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Improvement of digital, analog/RF and linearity performances of charge plasma based junctionless FinFET through spacer layer engineering;Micro and Nanostructures;2024-11

2. Design of high efficient low power static logic circuit using SG FinFET;International Journal of Electronics;2023-09-21

3. Effects of the Electrical Polarizations on the Thermal Response of FinFET Nanotransistors;2023 IEEE International Conference on Advanced Systems and Emergent Technologies (IC_ASET);2023-04-29

4. Temperature Effects on Electrical Response of FinFET Transistors in the Static Regime;IEEE Transactions on Electron Devices;2023-04

5. Estimating the performance of SOI FinFET transistor using electro-thermal formulation in conjunction with the quasi-ballistic effective electron mobility approach;Micro and Nanostructures;2022-06