Micro-twin Defects in InSb/AlInSb layers grown on (001) GaAs ∼ Application of the <mml:math altimg="si1.gif" display="inline" overflow="scroll" xmlns:xocs="http://www.elsevier.com/xml/xocs/dtd" xmlns:xs="http://www.w3.org/2001/XMLSchema" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns="http://www.elsevier.com/xml/ja/dtd" xmlns:ja="http://www.elsevier.com/xml/ja/dtd" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:tb="http://www.elsevier.com/xml/common/table/dtd" xmlns:sb="http://www.elsevier.com/xml/common/struct-bib/dtd" xmlns:ce="http://www.elsevier.com/xml/common/dtd" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:cals="http://www.elsevier.com/xml/common/cals/dtd"><mml:mrow><mml:mo>〈</mml:mo><mml:mover accent="true"><mml:mrow><mml:mn>1</mml:mn></mml:mrow><mml:mrow><mml:mo>̄</mml:mo></mml:mrow></mml:mover><mml:mn>16</mml:mn><mml:mo>〉</mml:mo></mml:mrow></mml:math>-directional TEM analysis ∼-Reference-Cited by-同舟云学术

Micro-twin Defects in InSb/AlInSb layers grown on (001) GaAs ∼ Application of the 〈1̄16〉-directional TEM analysis ∼

Author:

Mishima T.D.,Santos M.B.

Publisher

Elsevier BV

Subject

General Engineering

Reference17 articles.

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