Regression Analysis for Transport Electron Scattering Caused by Structural Defects in InSb Quantum Wells: Application of Matthiessen's Formula
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Published:2012-06-20
Issue:
Volume:51
Page:06FE07
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ISSN:0021-4922
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Container-title:Japanese Journal of Applied Physics
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language:en
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Short-container-title:Jpn. J. Appl. Phys.
Author:
Mishima Tetsuya D.,Santos Michael B.
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering