Ultra low power offering 14 nm bulk double gate FinFET based SRAM cells

Author:

M. Damodhar Rao,Y.V. Narayana,V.V.K.D.V. Prasad

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,General Computer Science

Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Design of Enhanced Reversible 9T SRAM Design for the Reduction in Sub-threshold Leakage Current with14nm FinFET Technology;ACM Transactions on Design Automation of Electronic Systems;2023-10-28

2. A low-power SRAM design with enhanced stability and ION/IOFF ratio in FinFET technology for wearable device applications;International Journal of Electronics;2023-07-25

3. A Comparative Analyze of FinFET and Bulk MOSFET SRAM Design;2022 International Conference on Applied Physics and Computing (ICAPC);2022-09

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