Stacking fault pyramids, island growth and misfit dislocations in InxGa1−xAs/InP heterostructures grown by vapour phase epitaxy
Author:
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference13 articles.
1. Epitaxial Growth;Matthews,1975
2. Defect structure in III‐V compound semiconductors: Generation and evolution of defect structures in InGaAs and InGaAsP epitaxial layer grown by hydride transport vapor‐phase epitaxy
3. Misfit stress in InGaAs/InP heteroepitaxial structures grown by vapor‐phase epitaxy
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1. Correlation of early-stage growth process conditions with dislocation evolution in MOCVD-based GaP/Si heteroepitaxy;Journal of Crystal Growth;2021-10
2. A Route to Obtaining Low-Defect III–V Epilayers on Si(100) Utilizing MOCVD;Crystal Growth & Design;2021-08-23
3. Tunnel Junction with Autodoped AlGaAs on InP;Journal of Electronic Materials;2013-07-30
4. Transmission electron microscopy and cathodoluminescence of tensile‐strained GaxIn1−xP/InP heterostructures. I. Spatial variations of the tensile stress relaxation;Journal of Applied Physics;1996-07-15
5. Dislocation generation mechanisms of InxGa1−xAs (0≤x≤1) epilayers grown on (100) InP substrates by molecular beam epitaxy;Journal of Applied Physics;1994-02
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