Transmission electron microscopy and cathodoluminescence of tensile‐strained GaxIn1−xP/InP heterostructures. I. Spatial variations of the tensile stress relaxation-Reference-Cited by-同舟云学术

Transmission electron microscopy and cathodoluminescence of tensile‐strained GaxIn1−xP/InP heterostructures. I. Spatial variations of the tensile stress relaxation

Published:1996-07-15 Issue:2 Volume:80 Page:827-836
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:

Author:

Cléton F.¹,Sieber B.¹,Lefebvre A.¹,Bensaada A.²,Masut R. A.²,Bonard J. M.³,Ganière J. D.³,Ambri M.⁴

Affiliation:

1. Laboratoire de Structure et Propriétés de l'Etat Solide, URA CNRS 234, Bâtiment C6, Université des Sciences et Technologies de Lille, 59655 Villeneuve d'Ascq Cedex, France

2. Groupe de Recherche en Physique et Technologie des Couches Minces, Ecole Polytechnique, C.P. 6218, Montréal, Québec H3C 3A7, Canada

3. IMO, Département de Physique, Ecole Polytechnique Fédérale de Lausanne, CH 1015 Lausanne, Switzerland

4. Département de Physique des Matériaux, Université Claude Bernard Lyon 1, URA CNRS 172, 43 Boulevard du 11 Novembre 1918, 68622 Villeurbanne Cedex, France

Publisher

AIP Publishing

Subject

General Physics and Astronomy

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