A physics-based drain current model for Si1-xGex source/drain NT JLFET for enhanced hot carrier reliability with temperature measurement
Author:
Publisher
Elsevier BV
Subject
General Engineering
Reference41 articles.
1. Performance estimation of junctionless multigate transistors;Lee;Solid State Electron.,2010
2. Junctionless multigate field-effect transistor;Lee;Appl. Phys. Lett.,2009
3. Nanowire transistors without junctions;Colinge;Nat. Nanotechnol.,2010
4. Comparison of junctionless and conventional trigate transistors with Lg down to 26 nm;Rios;IEEE Electron. Device Lett.,2011
5. Diameter dependency of leakage current in nanowire junctionless field effect transistors;Sahay;IEEE Trans. Electron. Dev.,2017
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