Dwell time adjustment for focused ion beam machining
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference15 articles.
1. Electron wave interference induced by electrons emitted from Pt field emitter fabricated by focused-ion-beam-induced deposition
2. Focused ion beam direct deposition and its applications
3. Three-dimensional nanostructure fabrication by focused-ion-beam chemical vapor deposition
4. Free-space-wiring fabrication in nano-space by focused-ion-beam chemical vapor deposition
5. Beam-assisted-etching technique for fabrication of single crystal diamond field emitter tip
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3. Thermal Nanoimprint Lithography—A Review of the Process, Mold Fabrication, and Material;Nanomaterials;2023-07-08
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