Study on thermoreflectance linear relation of gallium nitride epitaxial structures at above-bandgap wavelength
Author:
Funder
Fundamental Research Funds for the Central Universities
Guangxi Key Research and Development Program
National Natural Science Foundation of China
Publisher
Elsevier BV
Reference44 articles.
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2. Characterization of thin metal films via frequency-domain thermoreflectance;Schmidt;J. Appl. Phys.,2010
3. Analysis of heat flow in layered structures for time-domain thermoreflectance;Cahill;Rev. Sci. Instrum.,2004
4. Ultrafast thermoreflectance techniques for measuring thermal conductivity and interface thermal conductance of thin films;Zhu;J. Appl. Phys.,2010
5. Thermal Boundary resistance in GaN films measured by time domain thermoreflectance with robust Monte Carlo uncertainty estimation;Bougher;Nanoscale Microscale Thermophys. Eng.,2016
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