Characterization of thin metal films via frequency-domain thermoreflectance
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3289907
Reference21 articles.
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4. Laptop photothermal reflectance measurement instrument assembled with optical fiber components
5. Thermal-wave detection and thin-film thickness measurements with laser beam deflection
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