Ultrafast thermoreflectance techniques for measuring thermal conductivity and interface thermal conductance of thin films-Reference-Cited by-同舟云学术

Ultrafast thermoreflectance techniques for measuring thermal conductivity and interface thermal conductance of thin films

Published:2010-11 Issue:9 Volume:108 Page:094315
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Zhu Jie,Tang Dawei,Wang Wei,Liu Jun,Holub Kristopher W.,Yang Ronggui

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.3504213

Reference29 articles.

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4. Thermal conductivity of amorphous solids above the plateau

5. Thermal conductivity measurement from 30 to 750 K: the 3ω method

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