Electron beam testability of monolithic microwave integrated circuits (MMIC)-Reference-Cited by-同舟云学术

Electron beam testability of monolithic microwave integrated circuits (MMIC)

Published:1990-05 Issue:1-4 Volume:12 Page:287-293
ISSN:0167-9317
Container-title:Microelectronic Engineering
language:en
Short-container-title:Microelectronic Engineering

Author:

Mertin Wolfgang,Herrmann Klaus Dieter,Kubalek Erich

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference19 articles.

1. GaAs monolithic microwave integrated circuits;Decker,1985

2. Electron beam test techniques for integrated circuits;Menzel;Scanning Electron Microscopy,1981

3. Electron beam testing;Wolfgang;Microelectronic Engineering,1886

4. Electron beam testing;Ura;Advances in Electronics and Electron Physics,1989

5. A phase-shift technique for high-speed e-beam testing with picosecond time resolution;Winkler;Scanning,1989

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Two-dimensional field mapping of monolithic microwave integrated circuits using electrooptic sampling techniques;Optical and Quantum Electronics;1996-07

2. New aspects in electro-optic sampling;Microelectronic Engineering;1996-02

3. Comparison of measurement results obtained by electron beam testing and indirect electro-optic sampling;Microelectronic Engineering;1996-02

4. Characterization of a MMIC by direct and indirect electro-optic sampling and by network analyzer measurements;Microelectronic Engineering;1994-03

5. High-Speed Techniques;Electron Beam Testing Technology;1993