1. K. Nakamae, S. Fujita, H. Fujioka, and K. Ura, Jpn. J. Appl. Phys. series 3, 357 (1989).
2. D. J. Machin, D. W. Ranasinghe, and G. Proctor, Microelectron. Eng.
7, 201 (1987).
3. H. Fujioka and K. Ura, J. Phys. E
18, 284 (1985).
4. M. Ostrow, E. Menzel, E. Postulka, S. Görlich, and E. Kubalek, in: Scanning Electron Microscopy 1982/II, SEM, Inc., AMF O’Hare, IL, pp. 563–572 (1982).
5. H. P. Feuerbaum, Scanning
5, 14 (1983).