Electron Beam Testing
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Publisher
Elsevier
Reference230 articles.
1. The use of the electron‐beam‐induced current mode of the SEM for observing emitter/collector pipes in bipolar transistors
2. Radiation Hardening of MOS Transistors for Low Ionizing Dose Levels
Cited by 16 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Analytical analysis and simulation on fringe field effect of deflector plates applied in ultrafast electron microscopy;Micron;2019-11
2. Notes and References;Principles of Electron Optics;2018
3. Electron Optics of Low-Voltage Electron Beam Testing and Inspection. Part I: Simulation Tools ✶ ✶Reprinted from Advances in Optical and Electron Microscopy, vol. 13, 1994, 123–242.;Advances in Imaging and Electron Physics;2018
4. Tilting and moving-object lens for a 3D electron microscope;Microscopy;2016-09-01
5. Space charge characteristics of an insulating thin film negatively charged by a low-energy electron beam;Microscopy;2012-01-02
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